Basalt contamination by continental crust; some experiments and models

Saved in:
Authors:Watson, E. B.
Author Affiliations:Primary:
Rensselaer Polytech. Inst., Troy, NY 12181, United States
Volume Title:Contributions to Mineralogy and Petrology
Source:Contributions to Mineralogy and Petrology, 80(1), p.73-87. Publisher: Springer International, Heidelberg-New York, International. ISSN: 0010-7999
Publication Date:1982
Note:In English. 35 refs.; illus. incl. 4 anal., 2 tables, chart
Summary:Chemical interaction between molten basalt and felsic minerals of the continental crust was examined in static and dynamic experiments at 1200°-1400°C. Under continuous stirring at 1400°C, beta -quartz dissolves in tholeiite melt at a rate of 3.3 X 10-6 g/s per cm2 of contact area; at 1300°C the solution rate is 1.5 X 10-6 g/cm2s. The feldspars are molten at the experimental conditions, and interact with contacting basalt melt by a complex process of diffusion. Alkali diffusion may be 'uphill' or 'downhill' depending on which direction of net flux is required to produce a two-liquid distribution. Once this distribution is attained, subsequent diffusion of all melt species is slow and apparently limited by the diffusivity of SiO2. The solution rates and interdiffusion data can be used to model basalt contamination processes likely to occur in the continental crust. [P.Br.]
Subjects:Alkali feldspar; Basaltic composition; Basalts; Continental crust; Crust; Diffusion; Electron probe data; Experimental studies; Feldspar group; Framework silicates; Geochemistry; High temperature; Igneous rocks; Magmas; Microcline; Migration of elements; Models; Oligoclase; Plagioclase; Pollution; Pressure; Quartz; Silica minerals; Silicates; Temperature; Tholeiitic composition; Volcanic rocks; Solution rates
Abstract Numbers:83M/1430
Record ID:1985080264
Copyright Information:GeoRef, Copyright 2019 American Geosciences Institute. Reference includes data from Mineralogical Abstracts, United Kingdom, Twickenham, United Kingdom, Reference includes data from PASCAL, Institute de l'Information Scientifique et Technique
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items