Implication of TEM data for the concept of fundamental particles

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Authors:Peacor, D. R.
Author Affiliations:Primary:
University of Michigan, Department of Geological Sciences, Ann Arbor, MI, United States
Volume Title:XRD and electron-microscopy investigations of layer silicates
Volume Authors:Martin, R. F., editor
Source:The Canadian Mineralogist, Vol.36(Part 6), p.1397-1408; 11th international clay conference, Ottawa, ON, Canada, 1997, edited by R. F. Martin. Publisher: Mineralogical Association of Canada, Ottawa, ON, Canada. ISSN: 0008-4476
Publication Date:1998
Note:In English with French summary. 36 refs.
Sections:Clay minerals
Subsections:Techniques; structure; properties
Subjects:Clay mineralogy; Clay minerals; Crystals; Illite; Mineral interlayer; Particles; Sample preparation; Sheet silicates; Silicates; Single-crystal method; Smectite; TEM data; Fundamental particles
Abstract Numbers:00M/2371
Record ID:1999046667
Copyright Information:GeoRef, Copyright 2019 American Geosciences Institute.
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